Kodu | Dersin Adı | Yarıyıl | Süresi(T+U) | Kredisi | AKTS Kredisi |
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GMY237 | TEMEL ELEKTRONİK LAB | 3 | 4 | 2 | 3 |
DERS BİLGİLERİ |
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Dersin Öğretim Dili : | Türkçe |
Dersin Düzeyi | BACHELOR'S DEGREE, TYY: + 6.Level, EQF-LLL: 6.Level, QF-EHEA: First Cycle |
Dersin Türü | Zorunlu |
Dersin Veriliş Şekli | - |
Dersin Koordinatörü | Assist.Prof. SİNEM GÜRKAN |
Dersi Veren Öğretim Üyesi/Öğretim Görevlisi | Dr.Öğr.Üyesi KANAN BABANLI |
Ders Ön Koşulu | Yok |
AMAÇ VE İÇERİK |
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Amaç: | The aim of this course is to introduce students to the production and operational characteristics of various semiconductor electronic devices, along with their electrical properties. Additionally, it seeks to equip students with the skills necessary to analyze and simulate basic electronic circuits that utilize these components. |
İçerik: | Fundamental Electronics is one of the core courses of the program. The materials introduced in this course will be applied in other technical courses. A strong understanding of the topics is directly proportional to success in mathematics and direct current circuit analysis courses. |
DERSİN ÖĞRENME ÇIKTILARI (Öğrenciler, bu dersi başarı ile tamamladıklarında aşağıda belirtilen bilgi, beceri ve/veya yetkinlikleri gösterirler.) |
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Defines the applications of electronics in industry. |
Interprets information regarding electronic components and devices and their roles in electronic circuits. |
Applies basic electronic circuit analysis methods. |
Utilizes instruments and devices in the electronics laboratory, as well as electronic circuit simulation software. |
Analyzes basic electronic circuits. |
HAFTALIK DERS KONULARI VE ÖNGÖRÜLEN HAZIRLIK ÇALIŞMALARI |
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Hafta | Ön Hazırlık | Konular | Yöntem |
1 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
2 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
3 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
4 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
5 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
6 | - | Diode Symbols; Characteristics and Properties of Diodes; Series and Parallel Diodes; Key Characteristics and Applications of Silicon-Controlled Rectifiers (SCRs), Light Emitting Diodes (LEDs), Photoconductive Diodes, Varistors, and Rectifier Diodes; Functional Testing of Diodes | - |
7 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
8 | - | MID-TERM EXAM | - |
9 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
10 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
11 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
12 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
13 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
14 | - | **Materials, Electron Configuration, Electrical Properties; P-type and N-type Materials: Effects of Impurities on Conduction, Majority and Minority Carriers; PN Junction in Semiconductors, Potential Development across the PN Junction under Unbiased, Forward-biased, and Reverse-biased Conditions; Diode Parameters: Reverse Peak Voltage, Maximum Forward Current, Temperature, Frequency, Leakage Current, Power Loss; Operation and Function of Diodes in the Following Circuits: Clipping Circuits, Clamping Circuits, Full and Half-Wave Rectifiers, Bridge Rectifiers/Converters, Voltage Doublers and Triplers; Detailed Operation and Characteristic Properties of the Following Devices: Silicon-Controlled Rectifier (SCR), Light Emitting Diode (LED), Schottky Diode, Photoconductive Diode, Varactor Diode, Varistor, Rectifier Diodes, Zener Diode.** | - |
15 | - | GENERAL REVIEW | - |
16 | - | FINAL EXAM | - |
17 | - | FINAL EXAM | - |
KAYNAKLAR |
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EASA Part 66 - Modul3 - Elektrik Temelleri Temel Elektrik Elektronik I - Ders Notları Megep Modülleri Electronical Fundamentals, Electronic Fundamentals EASA Part-66 Module-3 Module-4 |
ÖLÇME VE DEĞERLENDİRME |
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Yarıyıl İçi Yapılan Çalışmaların Ölçme ve Değerlendirmesi | Etkinlik Sayısı | Katkı Yüzdesi | Açıklama | Sınav Yapılma Şekli |
Final Exam | 1 | 100 | ||
TOTAL | 1 | 100 |
(0) Etkisiz | (1) En Düşük | (2) Düşük | (3) Orta | (4) İyi | (5) Çok İyi |
---|---|---|---|---|---|
0 | 1 | 2 | 3 | 4 | 5 |
KNOWLEDGE | |||||||
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Theoretical | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Define the basic concepts of aeronautical standards and rules. (Bloom 1)
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3 |
KNOWLEDGE | |||||||
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Factual | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Organize teamwork during the collection, interpretation, announcement and application of data related to the field. (Bloom 6)
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2 |
SKILLS | |||||||
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Cognitive | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Perform theoretical and practical knowledge related to his/her field in business life using analytical methods and modeling techniques. (Bloom 4)
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5 | |||||
2 |
Use maintenance manuals and other sources of information in business life to obtain information about the field. (Bloom3)
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4 | |||||
3 |
Determine the actualities of all technical and administrative documents related with the field. (Bloom 1)
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3 | |||||
4 |
Perform theoretical and practical knowledge related to his/her field in business life using analytical methods and modeling techniques. (Bloom 4)
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3 |
SKILLS | |||||||
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Practical | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Use computer software, information and communication technologies at the level required by the field. (Bloom 3)
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4 | |||||
2 |
Interpret the sketches, scheme, graphics that describe the subject. (Bloom 2)
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0 |
OCCUPATIONAL | |||||||
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Autonomy & Responsibility | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Develop solutions for problems faced during application. (Bloom 6)
|
2 |
OCCUPATIONAL | |||||||
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Learning to Learn | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Determine the learning requirements related with his/her field. (Bloom 3)
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2 | |||||
2 |
Use the lifelong learning principles in occupational development. (Bloom 3)
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3 |
OCCUPATIONAL | |||||||
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Communication & Social | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Apply the technical drawing knowledge effectively in business life. (Bloom 3)
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5 | |||||
2 |
By informing the relevant persons and institutions about the related field; state his / her thoughts and suggestions for solutions in the field.(Bloom 1)
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2 | |||||
3 |
Debate his/her ideas and solution suggestions with experts by supporting them with quantitative and qualitative data. (Bloom 2)
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3 | |||||
4 |
Participate in training related to the field at international level. (Bloom 3)
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1 | |||||
5 |
Organize activities for the professional development of employees under his/her responsibility. (Bloom 6).
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3 |
OCCUPATIONAL | |||||||
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Occupational and/or Vocational | |||||||
Program Yeterlilikleri/Çıktıları | Katkı Düzeyi | ||||||
0 | 1 | 2 | 3 | 4 | 5 | ||
1 |
Use the knowledge and skills obtained during undergraduate education in work life. (Bloom 3)
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4 | |||||
2 |
Solve the problems encountered in his/her field. (Bloom 3)
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0 | |||||
3 |
Apply the necessary culture of behavior in the areas of quality management and processes and environmental protection and occupational safety (Bloom 3)
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1 | |||||
4 |
Locate the awareness of safety factor to himself and to the team. (Bloom 1)
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3 |
DERSİN İŞ YÜKÜ VE AKTS KREDİSİ |
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Öğrenme-Öğretme Etkinlikleri İş Yükü | |||
Öğrenme-Öğretme Etkinlikleri | Etkinlik(hafta sayısı) | Süresi(saat sayısı) | Toplam İş Yükü |
Lecture & In-Class Activities | 0 | 0 | 0 |
Preliminary & Further Study | 0 | 0 | 0 |
Land Surveying | 0 | 0 | 0 |
Group Work | 0 | 0 | 0 |
Laboratory | 0 | 0 | 0 |
Reading | 0 | 0 | 0 |
Assignment (Homework) | 0 | 0 | 0 |
Project Work | 0 | 0 | 0 |
Seminar | 0 | 0 | 0 |
Internship | 0 | 0 | 0 |
Technical Visit | 0 | 0 | 0 |
Web Based Learning | 0 | 0 | 0 |
Implementation/Application/Practice | 0 | 0 | 0 |
Practice at a workplace | 0 | 0 | 0 |
Occupational Activity | 0 | 0 | 0 |
Social Activity | 0 | 0 | 0 |
Thesis Work | 0 | 0 | 0 |
Field Study | 0 | 0 | 0 |
Report Writing | 0 | 0 | 0 |
Final Exam | 0 | 0 | 0 |
Preparation for the Final Exam | 0 | 0 | 0 |
Mid-Term Exam | 0 | 0 | 0 |
Preparation for the Mid-Term Exam | 0 | 0 | 0 |
Short Exam | 0 | 0 | 0 |
Preparation for the Short Exam | 0 | 0 | 0 |
TOTAL | 0 | 0 | 0 |
Genel Toplam | 0 | ||
Toplam İş Yükü / 25.5 | 0 | ||
Dersin AKTS(ECTS) Kredisi | 0,0 |